VIA NEXT

Design for Testing

We provide:

Testability Design

Testability Design

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Result Analysis and Summary

Result Analysis and Summary

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System Level Testing

System Level Testing

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Testability Design

Learn More

Result Analysis and Summary

Learn More

System Level Testing

Learn More
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Testability Design
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Result Analysis and Summary
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System Level Testing
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Design for Testing

Testability Design

With our structured and automated testing methodology, VIA NEXT can help easily detect any defects in your product’s IC design, ensuring your product is robust and fully standards compliant before reaching the market.

PKG
UBI
Mark
VMI
CP
FTH
FTC
SLT
FG
  • Die Temp. @25°C
  • Fault Coverage Test
  • MFG ID
  • Die Temp. @90°C
  • Fault Coverage Test
  • FTH_minV
  • Max Power
  • Guard Band(GB)
  • PLL Calibration
  • Speed Binning
  • Per Part Database
  • Die Temp. @5°C
  • Fault Coverage Test
  • FTC_minV
  • Parallax Offset
  • P/F@FTH_minV + GB
  • Efuse
  • Product ID
  • Per Part Database
CP
PKG
FTH
UBI
FTC
Mark
SLT
VMI
FG
  • Die Temp. @25°C
  • Fault Coverage Test
  • MFG ID
  • Die Temp. @90°C
  • Fault Coverage Test
  • FTH_minV
  • Max Power
  • Guard Band(GB)
  • PLL Calibration
  • Speed Binning
  • Per Part Database
  • Die Temp. @5°C
  • Fault Coverage Test
  • FTC_minV
  • Parallax Offset
  • P/F@FTH_minV + GB
  • Efuse
  • Product ID
  • Per Part Database

We provide:

  • DFT test plan of logic ATPG & logic/memory BIST
  • Stuck-at, functional, and speed fault coverage report
  • Correlation analysis and report for coverage enhancement
  • CP/FT Wafer test program development
  • Probe card, load board, and active thermal control design

Design for Testing

Result Analysis and Summary

With our unique, proprietary DFT test circuit, VIA NEXT can easily aggregate and analyse IC testing data, allowing us to provide you with the data you need to improve your product’s design and yield.

3.3.2-1
3.3.2-2
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Design for Testing

System Level Testing

For more complex circuits which can’t be tested with fully automated tests, VIA NEXT can provide you with the capability to perform System Level Testing (SLT), allowing for direct test results at a lower cost.


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Data Collection and Analysis
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Next

We provide:

  • SLT Board and Thermal Control Design
  • Customized SLT Software Development
  • Real-Time Monitoring of Test Results and Platform Status
  • SLT Data Collection and Analysis